Chromatogram trace dips when the baffle turns on a SYNAPT - WKB24514
Article number: 24514
SYMPTOMS
- A periodic dip in the TIC or chromatogram correlates with turning of the baffle
ENVIRONMENT
- Q-Tof Premier
- Q-Tof micro
- Q-Tof Ultima API
- Q-Tof Ultima Global
- Synapt HDMS
- SYNAPT G2
- SYNAPT G2 MS/HDMS
- SYNAPT G2-S MS/HDMS
- SYNAPT G2-Si MS/HDMS
- SYNAPT G2-S
- SYNAPT G2-Si
- Vion IMS QTof
- Xevo QTof
- Xevo Tof
- Xevo G2 QTof
- Xevo G2 Tof
- Xevo G2-S
- Xevo G2-S QTof
- Xevo G2-S Tof
- Xevo G2-XS
- Xevo G2-XS QTof
- Xevo G2-XS Tof
CAUSE
Dirty source lens
FIX or WORKAROUND
Remove the source lens (hexapole, source TWIG, or StepWave) and clean it.
ADDITIONAL INFORMATION
id24514, MALDIG2SI, QTOFAPIUS, QTOFGLBL, QTOFMICRO, QTOF-PREM, QTOFULTAPI, SYNAPT, SYNAPTMS, SYNG2HD, SYNG2HDMAL, SYNG2MS, SYNG2MSMAL, SYNG2SHD, SYNG2SHDML, SYNG2SIHD, SYNG2SIMS, SYNG2SMS, SYNG2SMSML, XEVOG2QTOF, XEVOG2SQTF, XEVOG2STOF, XEVOG2TOF, XEVOG2XSTF, XEVOQTOF